New approach to analysis machine learning base power quality in a test grid system
S. M. Salam; M. M. Rashid; M. Y. Ali; S. Yvette
- Published
- Publisher
- AIP Publishing
- Journal / collection
- AIP Conference Proceedings
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1063/5.0229873
The original publisher provides the full text and its access options.
Cite this source
S. M. Salam; M. M. Rashid; M. Y. Ali; S. Yvette. New approach to analysis machine learning base power quality in a test grid system. AIP Conference Proceedings. 2024. https://doi.org/10.1063/5.0229873