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Research literature / Conference paper

Transistor Matrix Array for Measuring Variability and Random Telegraph Noise at Cryogenic Temperatures

Tomoko Mizutani; Kiyoshi Takeuchi; Takuya Saraya; Hiroshi Oka; Takahiro Mori; Masaharu Kobayashi; Toshiro Hiramoro

Published
Publisher
IEEE
Journal / collection
2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/icmts59902.2024.10520700

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Tomoko Mizutani; Kiyoshi Takeuchi; Takuya Saraya; Hiroshi Oka; Takahiro Mori; Masaharu Kobayashi; Toshiro Hiramoro. Transistor Matrix Array for Measuring Variability and Random Telegraph Noise at Cryogenic Temperatures. 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS). 2024-04-15. https://doi.org/10.1109/icmts59902.2024.10520700

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