Thermal Management and Degradation Mechanisms in Heterogeneously Integrated Silicon Photonic Light Sources
Chin Wei Sher; Huang-Yu Lin; Yu Lin Teng; Jen-Shuo Liao; Ta Yung Liu; Hao Chung Kuo; Chiu Pei-Ju; Yu Feng Ko
- Published
- Publisher
- ASM International
- Journal / collection
- International Symposium for Testing and Failure Analysis
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.31399/asm.cp.istfa2026p0608
The original publisher provides the full text and its access options.
Cite this source
Chin Wei Sher; Huang-Yu Lin; Yu Lin Teng; Jen-Shuo Liao; Ta Yung Liu; Hao Chung Kuo; Chiu Pei-Ju; Yu Feng Ko. Thermal Management and Degradation Mechanisms in Heterogeneously Integrated Silicon Photonic Light Sources. International Symposium for Testing and Failure Analysis. 2026-10-04. https://doi.org/10.31399/asm.cp.istfa2026p0608