A Study on the Origin of Dynamic Charge Loss of Next Generation DRAM Cell Array Transistor
Moonyoung Jeong; Hyungjun Noh; Sangho Lee; Yootak Jun; Jeonghoon Oh; Jemin Park; Jaihyuk Song
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 IEEE International Reliability Physics Symposium (IRPS)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/irps48204.2025.10982816
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Cite this source
Moonyoung Jeong; Hyungjun Noh; Sangho Lee; Yootak Jun; Jeonghoon Oh; Jemin Park; Jaihyuk Song. A Study on the Origin of Dynamic Charge Loss of Next Generation DRAM Cell Array Transistor. 2025 IEEE International Reliability Physics Symposium (IRPS). 2025-03-30. https://doi.org/10.1109/irps48204.2025.10982816