Utilizing Two Three-Transistor Structures for Designing Radiation Hardened Circuits
Xin Liu; Jiaxin Chen; Yinyu Liu; Ke Gu; Siqi Wang; Jianhui Bu; Quanfeng Zhou
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Device and Materials Reliability
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tdmr.2023.3344767
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Cite this source
Xin Liu; Jiaxin Chen; Yinyu Liu; Ke Gu; Siqi Wang; Jianhui Bu; Quanfeng Zhou. Utilizing Two Three-Transistor Structures for Designing Radiation Hardened Circuits. IEEE Transactions on Device and Materials Reliability. 2024-03. https://doi.org/10.1109/tdmr.2023.3344767