Skip to content
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Conference paper

Leveraging Optimization Algorithms for Robust L-I Model Fitting in Semiconductor Lasers

Haoyu Ye

Published
Publisher
IEEE
Journal / collection
2025 5th International Conference on Neural Networks, Information and Communication Engineering (NNICE)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/nnice64954.2025.11064369

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Haoyu Ye. Leveraging Optimization Algorithms for Robust L-I Model Fitting in Semiconductor Lasers. 2025 5th International Conference on Neural Networks, Information and Communication Engineering (NNICE). 2025-01-10. https://doi.org/10.1109/nnice64954.2025.11064369

Download RIS