EMI Noise Analysis Using Frequency Domain Simulation Considering Dynamic Semiconductor Characteristics in Flyback Converter Circuits
Taiki Kai; Tatsuki Kashihara; Koji Kobayashi
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.23919/emcjapan/apemcokinaw58965.2024.10584925
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Cite this source
Taiki Kai; Tatsuki Kashihara; Koji Kobayashi. EMI Noise Analysis Using Frequency Domain Simulation Considering Dynamic Semiconductor Characteristics in Flyback Converter Circuits. 2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa). 2024-05-20. https://doi.org/10.23919/emcjapan/apemcokinaw58965.2024.10584925