ELECTROPHYSICAL PROPERTIES OF SEMICONDUCTOR STRUCTURE WITH POROUS SILICON FILM IRRADIATED WITH NANOSECOND YTTERBIUM LASER
- Published
- Publisher
- Ryazan State Radio Engineering University RSREU
- Journal / collection
- Vestnik of Ryazan State Radio Engineering University
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.21667/1995-4565-2025-91-256-266
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Cite this source
Ryazan State Radio Engineering University RSREU. ELECTROPHYSICAL PROPERTIES OF SEMICONDUCTOR STRUCTURE WITH POROUS SILICON FILM IRRADIATED WITH NANOSECOND YTTERBIUM LASER. Vestnik of Ryazan State Radio Engineering University. 2025. https://doi.org/10.21667/1995-4565-2025-91-256-266