Current-Voltage Modeling of DRAM Cell Transistor Using Genetic Algorithm and Deep Learning
Jun Hui Park; Jung Nam Kim; Seonhaeng Lee; Gang-Jun Kim; Namhyun Lee; Rock-Hyun Baek; Dae Hwan Kim; Changhyun Kim; Myounggon Kang; Yoon Kim
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Access
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.1109/access.2024.3357241
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Cite this source
Jun Hui Park; Jung Nam Kim; Seonhaeng Lee; Gang-Jun Kim; Namhyun Lee; Rock-Hyun Baek; Dae Hwan Kim; Changhyun Kim; Myounggon Kang; Yoon Kim. Current-Voltage Modeling of DRAM Cell Transistor Using Genetic Algorithm and Deep Learning. IEEE Access. 2024. https://doi.org/10.1109/access.2024.3357241