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Research literature / Conference paper

Cotton Pest Trap Using Machine Learning Models

Vasudeva Rao P V; Permanki Guthu Rithesh Pakkala; Akhila Thejaswi R; Sudheer Shetty; Lakshmisha L; Kishor Naik; Shrinidhi S Shetty; Shreya S Shetty; Balamurali M

Published
Publisher
IEEE
Journal / collection
2024 International Conference on Computing, Semiconductor, Mechatronics, Intelligent Systems and Communications (COSMIC)
Research area
AI & compute
Source type
Conference paper
DOI
10.1109/cosmic63293.2024.10871670

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Vasudeva Rao P V; Permanki Guthu Rithesh Pakkala; Akhila Thejaswi R; Sudheer Shetty; Lakshmisha L; Kishor Naik; Shrinidhi S Shetty; Shreya S Shetty; Balamurali M. Cotton Pest Trap Using Machine Learning Models. 2024 International Conference on Computing, Semiconductor, Mechatronics, Intelligent Systems and Communications (COSMIC). 2024-11-22. https://doi.org/10.1109/cosmic63293.2024.10871670

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