PIC-MCC numerical simulation of volt-ampere characteristics for microcavity plasma transistor switches
X. Li; L. Chen; T. Yu; Y. Wang; X. Zhang
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IEEE International Conference on Plasma Science (ICOPS)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/icops58192.2024.10625853
The original publisher provides the full text and its access options.
Cite this source
X. Li; L. Chen; T. Yu; Y. Wang; X. Zhang. PIC-MCC numerical simulation of volt-ampere characteristics for microcavity plasma transistor switches. 2024 IEEE International Conference on Plasma Science (ICOPS). 2024-06-16. https://doi.org/10.1109/icops58192.2024.10625853