Transmission electron microscopy of epitaxial semiconductor materials and devices
Jiawei Dong; Hongjie Bai; Yong Deng; Shuo Liu; Xiaoyi Wang; Yang Qiu; Yuechun Shi; Thomas Walther
- Published
- Publisher
- IOP Publishing
- Journal / collection
- Journal of Physics D: Applied Physics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1088/1361-6463/ad8a6b
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Cite this source
Jiawei Dong; Hongjie Bai; Yong Deng; Shuo Liu; Xiaoyi Wang; Yang Qiu; Yuechun Shi; Thomas Walther. Transmission electron microscopy of epitaxial semiconductor materials and devices. Journal of Physics D: Applied Physics. 2024-11-04. https://doi.org/10.1088/1361-6463/ad8a6b