Exploration of the Effect of Silver Impurity on the Minority Carrier Lifetime of Semiconductor
Xin Tian; Peizhi Zhao; Yudong Li; Jun Xu; Tianling Ren
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IEEE 17th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/icsict62049.2024.10831188
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Cite this source
Xin Tian; Peizhi Zhao; Yudong Li; Jun Xu; Tianling Ren. Exploration of the Effect of Silver Impurity on the Minority Carrier Lifetime of Semiconductor. 2024 IEEE 17th International Conference on Solid-State & Integrated Circuit Technology (ICSICT). 2024-10-22. https://doi.org/10.1109/icsict62049.2024.10831188