Measurement procedure to generate a GaN power transistor surrogate model at GHz frequencies
Jan Henninger; Jan Hansen; David Pommerenke
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 International Symposium on Electromagnetic Compatibility – EMC Europe
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/emceurope59828.2024.10722242
The original publisher provides the full text and its access options.
Cite this source
Jan Henninger; Jan Hansen; David Pommerenke. Measurement procedure to generate a GaN power transistor surrogate model at GHz frequencies. 2024 International Symposium on Electromagnetic Compatibility – EMC Europe. 2024-09-02. https://doi.org/10.1109/emceurope59828.2024.10722242