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Research literature / Conference paper

Opposition Crow Search-based Optimal Feature Selection for Defect Classification by SVM in Semiconductor Wafer

S S Mohan Reddy; Y Nagendar; Ahmad Husseen; V Brahmam Yadav; Sasikumar Gurumoorthy

Published
Publisher
IEEE
Journal / collection
2024 International Conference on Distributed Computing and Optimization Techniques (ICDCOT)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/icdcot61034.2024.10515705

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S S Mohan Reddy; Y Nagendar; Ahmad Husseen; V Brahmam Yadav; Sasikumar Gurumoorthy. Opposition Crow Search-based Optimal Feature Selection for Defect Classification by SVM in Semiconductor Wafer. 2024 International Conference on Distributed Computing and Optimization Techniques (ICDCOT). 2024-03-15. https://doi.org/10.1109/icdcot61034.2024.10515705

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