Transistor Open-Circuit Fault Diagnosis for Three-Phase DAB Converters Using a Reduced Number of Sensors
Jonathan Emmanuel Ochoa Sosa; Rubén Orlando Núñez; G. Elías Oggier; Facundo Aguilera; Germán G. Oggier; Obaid Aldosari
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Open Journal of Power Electronics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/ojpel.2025.3600329
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Cite this source
Jonathan Emmanuel Ochoa Sosa; Rubén Orlando Núñez; G. Elías Oggier; Facundo Aguilera; Germán G. Oggier; Obaid Aldosari. Transistor Open-Circuit Fault Diagnosis for Three-Phase DAB Converters Using a Reduced Number of Sensors. IEEE Open Journal of Power Electronics. 2025. https://doi.org/10.1109/ojpel.2025.3600329