Facile interfacial defect healing in solution-processed In-Ga-Zn-O thin film transistor through rapid intense pulsed light annealing
Hyun Jae Kim; Kimoon Lee; Chul Jong Han; Byungwook Yoo; Joonho Bang; Se Yun Kim; Seongil Im; Kyu Hyoung Lee; Min Suk Oh
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Surfaces and Interfaces
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.surfin.2023.103751
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Cite this source
Hyun Jae Kim; Kimoon Lee; Chul Jong Han; Byungwook Yoo; Joonho Bang; Se Yun Kim; Seongil Im; Kyu Hyoung Lee; Min Suk Oh. Facile interfacial defect healing in solution-processed In-Ga-Zn-O thin film transistor through rapid intense pulsed light annealing. Surfaces and Interfaces. 2024-01. https://doi.org/10.1016/j.surfin.2023.103751