Examination of transistor characteristics derived through printed technologies
Oleg Telminov
- Published
- Publisher
- Akademizdatcenter Nauka
- Journal / collection
- Электронная техника Серия 3 Микроэлектроника
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.7868/s2410993225010063
The original publisher provides the full text and its access options.
Cite this source
Oleg Telminov. Examination of transistor characteristics derived through printed technologies. Электронная техника Серия 3 Микроэлектроника. 2025. https://doi.org/10.7868/s2410993225010063