Image Defect Detection Using Machine Learning
Nageswara Reddy K; Charan Teja G; Pravallika Y; Sowjanya K; Sai Sandhya A
- Published
- Publisher
- Tejass Publishers
- Journal / collection
- IJARCCE
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.17148/ijarcce.2024.134120
The original publisher provides the full text and its access options.
Cite this source
Nageswara Reddy K; Charan Teja G; Pravallika Y; Sowjanya K; Sai Sandhya A. Image Defect Detection Using Machine Learning. IJARCCE. 2024-04-20. https://doi.org/10.17148/ijarcce.2024.134120