Skip to content
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Journal article

Predictive maintenance in semiconductor manufacturing: Comparative analysis of machine learning models for downtime reduction

Suriya Phongmoo; Chaichana Suedumrong; Chakkrapong Kuensaen; Runchana Sinthavalai; Komgrit Leksakul

Published
Publisher
Elsevier BV
Journal / collection
Computers & Industrial Engineering
Research area
AI & compute
Source type
Journal article
DOI
10.1016/j.cie.2025.111211

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Suriya Phongmoo; Chaichana Suedumrong; Chakkrapong Kuensaen; Runchana Sinthavalai; Komgrit Leksakul. Predictive maintenance in semiconductor manufacturing: Comparative analysis of machine learning models for downtime reduction. Computers & Industrial Engineering. 2025-07. https://doi.org/10.1016/j.cie.2025.111211

Download RIS