Investigation of Heterojunction Bipolar Transistor Reliability for Analog and RF Applications
F. Cacho; J. Hai; N. Revil; B. Van-Haaren; N. Quesseveur; V. Yon; P. Cathelin; J. Forest; V. Knopik; T. Lapergue; S. Bouvot; R. Debroucke; S. Jan
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IEEE International Integrated Reliability Workshop (IIRW)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/iirw62856.2024.10947136
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Cite this source
F. Cacho; J. Hai; N. Revil; B. Van-Haaren; N. Quesseveur; V. Yon; P. Cathelin; J. Forest; V. Knopik; T. Lapergue; S. Bouvot; R. Debroucke; S. Jan. Investigation of Heterojunction Bipolar Transistor Reliability for Analog and RF Applications. 2024 IEEE International Integrated Reliability Workshop (IIRW). 2024-10-06. https://doi.org/10.1109/iirw62856.2024.10947136