Analysis of High Temperature Characteristics of Double Gate Feedback Field Effect Transistor
Myeongho Park; Kichan Kim; Seungyeon Oh; Il-Hwan Cho
- Published
- Publisher
- The Institute of Electronics Engineers of Korea
- Journal / collection
- JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.5573/jsts.2024.24.1.33
The original publisher provides the full text and its access options.
Cite this source
Myeongho Park; Kichan Kim; Seungyeon Oh; Il-Hwan Cho. Analysis of High Temperature Characteristics of Double Gate Feedback Field Effect Transistor. JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE. 2024-02-29. https://doi.org/10.5573/jsts.2024.24.1.33