Semiconductor Wafer Defect Detection Based on Machine Learning
Wenlong Gan
- Published
- Publisher
- Warwick Evans Publishing
- Journal / collection
- Transactions on Computer Science and Intelligent Systems Research
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.62051/wr098130
The original publisher provides the full text and its access options.
Cite this source
Wenlong Gan. Semiconductor Wafer Defect Detection Based on Machine Learning. Transactions on Computer Science and Intelligent Systems Research. 2024-10-17. https://doi.org/10.62051/wr098130