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Research literature / Conference paper

Toward Pattern-Oriented Machine Learning Reliability Argumentation

Takumi Ayukawa; Jati H. Husen; Nobukazu Yoshioka; Hironori Washizaki; Naoyasu Ubayashi

Published
Publisher
IEEE
Journal / collection
2024 IEEE 35th International Symposium on Software Reliability Engineering Workshops (ISSREW)
Research area
AI & compute
Source type
Conference paper
DOI
10.1109/issrew63542.2024.00065

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Takumi Ayukawa; Jati H. Husen; Nobukazu Yoshioka; Hironori Washizaki; Naoyasu Ubayashi. Toward Pattern-Oriented Machine Learning Reliability Argumentation. 2024 IEEE 35th International Symposium on Software Reliability Engineering Workshops (ISSREW). 2024-10-28. https://doi.org/10.1109/issrew63542.2024.00065

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