BIM-based automated rule-checking in the AECO industry: Learning from semiconductor manufacturing
Wawan Solihin; Ziwen Liu; Yujie Lu; Lai Wei
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Automation in Construction
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.autcon.2024.105406
The original publisher provides the full text and its access options.
Cite this source
Wawan Solihin; Ziwen Liu; Yujie Lu; Lai Wei. BIM-based automated rule-checking in the AECO industry: Learning from semiconductor manufacturing. Automation in Construction. 2024-06. https://doi.org/10.1016/j.autcon.2024.105406