Measurement setup for the characterization of integrated semiconductor circuits at cryogenic temperatures
P. J. Ritter; M.-A. Tucholke; M. Neumann; J. F. Mumme; A. Meyer; R. Roederer; Z. Guo; A. Pawlak; V. Issakov; M. Schilling; B. Hampel
- Published
- Publisher
- AIP Publishing
- Journal / collection
- Review of Scientific Instruments
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1063/5.0245525
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Cite this source
P. J. Ritter; M.-A. Tucholke; M. Neumann; J. F. Mumme; A. Meyer; R. Roederer; Z. Guo; A. Pawlak; V. Issakov; M. Schilling; B. Hampel. Measurement setup for the characterization of integrated semiconductor circuits at cryogenic temperatures. Review of Scientific Instruments. 2025-04-01. https://doi.org/10.1063/5.0245525