Peridynamic analysis of electro-mechanical-carrier coupling behavior in piezoelectric semiconductor plates with defects
Yuyan Xin; Zhiyuan Li; Yifan Qian; Dan Huang
- Published
- Publisher
- Elsevier BV
- Research area
- Semiconductors
- Source type
- Preprint / posted paper
- DOI
- 10.2139/ssrn.5674920
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Cite this source
Yuyan Xin; Zhiyuan Li; Yifan Qian; Dan Huang. Peridynamic analysis of electro-mechanical-carrier coupling behavior in piezoelectric semiconductor plates with defects. Elsevier BV. 2025. https://doi.org/10.2139/ssrn.5674920