Exploring photogenerated charge carrier transfer in semiconductor/metal junctions using Kelvin probe force microscopy
Chuanbiao Bie; Zheng Meng; Bowen He; Bei Cheng; Gang Liu; Bicheng Zhu
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Journal of Materials Science & Technology
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.jmst.2023.07.019
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Cite this source
Chuanbiao Bie; Zheng Meng; Bowen He; Bei Cheng; Gang Liu; Bicheng Zhu. Exploring photogenerated charge carrier transfer in semiconductor/metal junctions using Kelvin probe force microscopy. Journal of Materials Science & Technology. 2024-02. https://doi.org/10.1016/j.jmst.2023.07.019