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Research literature / Conference paper

A Semiconductor Manufacturing Final Test Yield Classification Using Random Forest

R. Dineshkumar; Srinivas Aluvala; Suma Srinath; Zaid Alsalami; V T Krishnaprasath

Published
Publisher
IEEE
Journal / collection
2024 Second International Conference on Data Science and Information System (ICDSIS)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/icdsis61070.2024.10594688

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R. Dineshkumar; Srinivas Aluvala; Suma Srinath; Zaid Alsalami; V T Krishnaprasath. A Semiconductor Manufacturing Final Test Yield Classification Using Random Forest. 2024 Second International Conference on Data Science and Information System (ICDSIS). 2024-05-17. https://doi.org/10.1109/icdsis61070.2024.10594688

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