Impact of Work-Function Variation in Ferroelectric Field-Effect Transistor
Su Yeon Jung; Hyunwoo Kim; Jongmin Lee; Jang Hyun Kim
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Journal of the Electron Devices Society
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/jeds.2024.3465594
The original publisher provides the full text and its access options.
Cite this source
Su Yeon Jung; Hyunwoo Kim; Jongmin Lee; Jang Hyun Kim. Impact of Work-Function Variation in Ferroelectric Field-Effect Transistor. IEEE Journal of the Electron Devices Society. 2024. https://doi.org/10.1109/jeds.2024.3465594