Low complex CNN for semiconductor wafer defect detection
P. Midula; Linu Shine; Neetha George
- Published
- Publisher
- SAGE Publications
- Journal / collection
- Journal of Intelligent & Fuzzy Systems
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.3233/jifs-219430
The original publisher provides the full text and its access options.
Cite this source
P. Midula; Linu Shine; Neetha George. Low complex CNN for semiconductor wafer defect detection. Journal of Intelligent & Fuzzy Systems. 2024-04-23. https://doi.org/10.3233/jifs-219430