Semiconductor Laser Chip Far-Field Divergence Angle Measurement
Cunyu Shi; Yuanhao Zhang; Weihua Guo; Qiaoyin Lu
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 Asia Communications and Photonics Conference (ACP) and International Conference on Information Photonics and Optical Communications (IPOC)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/acp/ipoc63121.2024.10809953
The original publisher provides the full text and its access options.
Cite this source
Cunyu Shi; Yuanhao Zhang; Weihua Guo; Qiaoyin Lu. Semiconductor Laser Chip Far-Field Divergence Angle Measurement. 2024 Asia Communications and Photonics Conference (ACP) and International Conference on Information Photonics and Optical Communications (IPOC). 2024-11-02. https://doi.org/10.1109/acp/ipoc63121.2024.10809953