Pioneering Excellence in Semiconductor Manufacturing via XGBoost with BAT Optimization for Cutting-Edge Predictive Maintenance
Abhishek Dwivedi; Nikhat Raza Khan
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IEEE International Conference on Big Data & Machine Learning (ICBDML)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/icbdml60909.2024.10577393
The original publisher provides the full text and its access options.
Cite this source
Abhishek Dwivedi; Nikhat Raza Khan. Pioneering Excellence in Semiconductor Manufacturing via XGBoost with BAT Optimization for Cutting-Edge Predictive Maintenance. 2024 IEEE International Conference on Big Data & Machine Learning (ICBDML). 2024-02-24. https://doi.org/10.1109/icbdml60909.2024.10577393