Skip to content
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Conference paper

Neural Network for Calibration of Electrical Models of Semiconductor Devices

M. Amira; A. Chvála

Published
Publisher
IEEE
Journal / collection
2024 15th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)
Research area
AI & compute
Source type
Conference paper
DOI
10.1109/asdam63148.2024.10844606

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

M. Amira; A. Chvála. Neural Network for Calibration of Electrical Models of Semiconductor Devices. 2024 15th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM). 2024-10-20. https://doi.org/10.1109/asdam63148.2024.10844606

Download RIS