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Research literature / Conference paper

AI-Driven Semiconductor Manufacturing via IC Failure Prediction: Cost-Effective Strategies for Process Improvement

P. Shailaja; K. Kranthi Kumar; K. Sirnivas; V. Bharath Simha Reddy; Kesana Mohana Lakshmi; D. Rajani

Published
Publisher
IEEE
Journal / collection
2024 International Conference on Distributed Systems, Computer Networks and Cybersecurity (ICDSCNC)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/icdscnc62492.2024.10939894

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P. Shailaja; K. Kranthi Kumar; K. Sirnivas; V. Bharath Simha Reddy; Kesana Mohana Lakshmi; D. Rajani. AI-Driven Semiconductor Manufacturing via IC Failure Prediction: Cost-Effective Strategies for Process Improvement. 2024 International Conference on Distributed Systems, Computer Networks and Cybersecurity (ICDSCNC). 2024-09-20. https://doi.org/10.1109/icdscnc62492.2024.10939894

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