Boron-Doped Aluminum Nitride Ferroelectric Field-Effect Transistors with ZnO Semiconductor Channel
Quyen Tran; John Hayden; Joseph Casamento; Jon-Paul Maria; Thomas N. Jackson
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 Device Research Conference (DRC)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/drc61706.2024.10605410
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Cite this source
Quyen Tran; John Hayden; Joseph Casamento; Jon-Paul Maria; Thomas N. Jackson. Boron-Doped Aluminum Nitride Ferroelectric Field-Effect Transistors with ZnO Semiconductor Channel. 2024 Device Research Conference (DRC). 2024-06-24. https://doi.org/10.1109/drc61706.2024.10605410