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Research literature / Conference paper

Multivariate analysis for signal pulse shape of TlBr semiconductor detectors

K. Watanabe; Y. Sugai; S. Tanaka; S. Hasegawa; K. Hitomi; M. Nogami

Published
Publisher
IEEE
Journal / collection
2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/nss/mic/rtsd57108.2024.10655584

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K. Watanabe; Y. Sugai; S. Tanaka; S. Hasegawa; K. Hitomi; M. Nogami. Multivariate analysis for signal pulse shape of TlBr semiconductor detectors. 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD). 2024-10-26. https://doi.org/10.1109/nss/mic/rtsd57108.2024.10655584

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