Breakdown Characteristics of Kilo-Voltage Drain Offset Corbino Thin Film Transistor and Carrier Conduction Model
Jiaquan Kong; Chuan Liu; Hai Ou; Juncong She; Shaozhi Deng; Jun Chen
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Electron Devices
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/ted.2024.3409646
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Cite this source
Jiaquan Kong; Chuan Liu; Hai Ou; Juncong She; Shaozhi Deng; Jun Chen. Breakdown Characteristics of Kilo-Voltage Drain Offset Corbino Thin Film Transistor and Carrier Conduction Model. IEEE Transactions on Electron Devices. 2024-08. https://doi.org/10.1109/ted.2024.3409646