Simulation study of leakage current in junction less field effect transistor
Anshu Chaudhary; Ashish Kumar Singh; Manoj Kumar Yadav; Gajendra Singh
- Published
- Publisher
- AIP Publishing
- Journal / collection
- AIP Conference Proceedings
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1063/5.0228728
The original publisher provides the full text and its access options.
Cite this source
Anshu Chaudhary; Ashish Kumar Singh; Manoj Kumar Yadav; Gajendra Singh. Simulation study of leakage current in junction less field effect transistor. AIP Conference Proceedings. 2024. https://doi.org/10.1063/5.0228728