Self-Adapting Power Density Sampling for On-Chip Thermal Prediction With Transistor-Level Granularity
Haifeng Chen; Wangyong Chen; Jiahui Chen; Haoyu Zhang; Linlin Cai
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Components, Packaging and Manufacturing Technology
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tcpmt.2024.3436595
The original publisher provides the full text and its access options.
Cite this source
Haifeng Chen; Wangyong Chen; Jiahui Chen; Haoyu Zhang; Linlin Cai. Self-Adapting Power Density Sampling for On-Chip Thermal Prediction With Transistor-Level Granularity. IEEE Transactions on Components, Packaging and Manufacturing Technology. 2024-08. https://doi.org/10.1109/tcpmt.2024.3436595