General neural network-based static performance prediction model construction techniques for gate-all-around and planar field effect transistor
Jing Chen; Jiahao Wu; Wei Du; Qing Yao; Kemeng Yang; Jun Zhang; Jiafei Yao; Yufeng Guo
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Microelectronics Journal
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.1016/j.mejo.2024.106485
The original publisher provides the full text and its access options.
Cite this source
Jing Chen; Jiahao Wu; Wei Du; Qing Yao; Kemeng Yang; Jun Zhang; Jiafei Yao; Yufeng Guo. General neural network-based static performance prediction model construction techniques for gate-all-around and planar field effect transistor. Microelectronics Journal. 2024-12. https://doi.org/10.1016/j.mejo.2024.106485