Testing of Radiation Hardened Power MOSFET Fabricated at LA Semiconductor
Adalin Benedetto; Paul Benedetto
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2024 NSREC)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/redw61286.2024.10759241
The original publisher provides the full text and its access options.
Cite this source
Adalin Benedetto; Paul Benedetto. Testing of Radiation Hardened Power MOSFET Fabricated at LA Semiconductor. 2024 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2024 NSREC). 2024-07-22. https://doi.org/10.1109/redw61286.2024.10759241