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Research literature / Conference paper

Failure Analysis Techniques and Lab Requirements for Silicon Photonics Fault Isolation

Ryan Sweeney; Brian Popielarski; Frieder Baumann; Matt Zotta; Paul Diglio; Felix Beaudoin

Published
Publisher
ASM International
Journal / collection
International Symposium for Testing and Failure Analysis
Research area
Semiconductors
Source type
Conference paper
DOI
10.31399/asm.cp.istfa2026p0387

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Ryan Sweeney; Brian Popielarski; Frieder Baumann; Matt Zotta; Paul Diglio; Felix Beaudoin. Failure Analysis Techniques and Lab Requirements for Silicon Photonics Fault Isolation. International Symposium for Testing and Failure Analysis. 2026-10-04. https://doi.org/10.31399/asm.cp.istfa2026p0387

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