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On the Scalability of Nanosheet Oxide Semiconductor FETs

Masaharu Kobayashi; Kaito Hikake; Xingyu Huang; Sunghun Kim; Kota Sakai; Zhuo Li; Tomoko Mizutani; Takuya Saraya; Toshiro Hiramoto; Takanori Takahashi; Mutsunori Uenuma; Yukiharu Uraoka

Published
Publisher
International Display Workshops General Incorporated Association
Journal / collection
Proceedings of the International Display Workshops
Research area
Semiconductors
Source type
Journal article
DOI
10.36463/idw.2024.0176

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Masaharu Kobayashi; Kaito Hikake; Xingyu Huang; Sunghun Kim; Kota Sakai; Zhuo Li; Tomoko Mizutani; Takuya Saraya; Toshiro Hiramoto; Takanori Takahashi; Mutsunori Uenuma; Yukiharu Uraoka. On the Scalability of Nanosheet Oxide Semiconductor FETs. Proceedings of the International Display Workshops. 2024-12-05. https://doi.org/10.36463/idw.2024.0176

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