Improved Defect Detection of Advanced Semiconductor Packaging in Acoustic Imaging
Zi-Ying Oh; Shao-Qian Chong; Arya Sukumaran Nair; Bernice Zee
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/ipfa61654.2024.10690939
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Cite this source
Zi-Ying Oh; Shao-Qian Chong; Arya Sukumaran Nair; Bernice Zee. Improved Defect Detection of Advanced Semiconductor Packaging in Acoustic Imaging. 2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). 2024-07-15. https://doi.org/10.1109/ipfa61654.2024.10690939