A Multi-Condition-Based Junction Temperature Estimation Technology for Double-Sided Cooled Insulated-Gate Bipolar Transistor Modules
Mengfan Chen; Guangyin Lei; Min Li; Shouzhong Chang; Sirui Wu; Huichuang Bao
- Published
- Publisher
- MDPI AG
- Journal / collection
- Energies
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.3390/en18071785
The original publisher provides the full text and its access options.
Cite this source
Mengfan Chen; Guangyin Lei; Min Li; Shouzhong Chang; Sirui Wu; Huichuang Bao. A Multi-Condition-Based Junction Temperature Estimation Technology for Double-Sided Cooled Insulated-Gate Bipolar Transistor Modules. Energies. 2025-04-02. https://doi.org/10.3390/en18071785