Focused ion beam as a tool for prototyping new designs of semiconductor lasers
M.I. Mitrofanov; A.A. Beckman; E.S. Kolodeznyi; A.S. Payusov; G.V. Voznyuk; V.P. Evtikhiev
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 International Conference Laser Optics (ICLO)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/iclo59702.2024.10624496
The original publisher provides the full text and its access options.
Cite this source
M.I. Mitrofanov; A.A. Beckman; E.S. Kolodeznyi; A.S. Payusov; G.V. Voznyuk; V.P. Evtikhiev. Focused ion beam as a tool for prototyping new designs of semiconductor lasers. 2024 International Conference Laser Optics (ICLO). 2024-07-01. https://doi.org/10.1109/iclo59702.2024.10624496