Reliability of Power Semiconductor Modules: A State-of-the-Art Review
Eneko Agirrezabala; Iosu Aizpuru; David Garrido; Ane Portillo
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Open Journal of Power Electronics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/ojpel.2025.3576994
The original publisher provides the full text and its access options.
Cite this source
Eneko Agirrezabala; Iosu Aizpuru; David Garrido; Ane Portillo. Reliability of Power Semiconductor Modules: A State-of-the-Art Review. IEEE Open Journal of Power Electronics. 2025. https://doi.org/10.1109/ojpel.2025.3576994