TCAD assessment of sub-10nm nanowire tunnel field effect transistor for enhanced electrical performances
Neha Gupta; Yash Mishra; Muskan; Kritika; Aman Sharma; Aditya Jain; Ajay Kumar
- Published
- Publisher
- AIP Publishing
- Journal / collection
- AIP Conference Proceedings
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1063/5.0294586
The original publisher provides the full text and its access options.
Cite this source
Neha Gupta; Yash Mishra; Muskan; Kritika; Aman Sharma; Aditya Jain; Ajay Kumar. TCAD assessment of sub-10nm nanowire tunnel field effect transistor for enhanced electrical performances. AIP Conference Proceedings. 2025. https://doi.org/10.1063/5.0294586