A Study on Solving the Problem of Semiconductor Chip Crack using TRIZ's Technological Contradiction Model
Kwang Ho Lee; Yong Won Song; Wan Bok Park; Sung Bok Kim; Jea Hyun Hu; Jung Hyeon Kim
- Published
- Publisher
- Future Convergence Technology Research Society
- Journal / collection
- Asia-pacific Journal of Convergent Research Interchange
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.47116/apjcri.2024.08.01
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Cite this source
Kwang Ho Lee; Yong Won Song; Wan Bok Park; Sung Bok Kim; Jea Hyun Hu; Jung Hyeon Kim. A Study on Solving the Problem of Semiconductor Chip Crack using TRIZ's Technological Contradiction Model. Asia-pacific Journal of Convergent Research Interchange. 2024-08-31. https://doi.org/10.47116/apjcri.2024.08.01